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High-Performance Double-Layer Nickel Nanocrystal Memory by Ion Bombardment Technique
Type
article
Resource
Sheng-Hsien Liu, Wen-Luh Yang, Yu-Hsien Lin, Chi-Chang Wu, Tien-Sheng Chao(2013).High-Performance Double-Layer Nickel Nanocrystal Memory by Ion Bombardment Technique. IEEE Transactions on Electron Devices.(60):3393-3399.
Date Issued
2013
Author(s)
Liu, Sheng-Hsien;Yang, Wen-Luh;Lin, Yu-Hsien;Wu, Chi-Chang;Chao, Tien-Sheng
Subjects
生醫材料暨組織工程研究所
期刊論文